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  • KOLs
  • Radiation Effects

Radiation Effects



Ronald D Schrimpf #1
Ronald D Schrimpf
Department of Electrical and Computer Engineering, Vanderbil
Known for Radiation Effects | Single Event | Gan Hemts | Dose Rate
Daniel M Fleetwood #2
Daniel M Fleetwood
Vanderbilt University, USA | Department of Electrical and Co
Known for Border Traps | Mos Devices | Radiation Effects | Gan Hemts

James R Schwank #3
James R Schwank
Sandia National Laboratories, Albuquerque, NM, 87185, USA |
Known for Hardness Assurance | Radiation Effects | Total Dose | Mos Devices
Marty R Shaneyfelt #4
Marty R Shaneyfelt
Sandia National Laboratories, Albuquerque, NM, 87185, USA |
Known for Border Traps | Total Dose | Hardness Assurance | Radiation Effects
Paul E Dodd Dodd #5
Paul E Dodd Dodd
Sandia National Laboratories, Albuquerque, NM, 87123, USA |
Known for Total Dose | Radiation Effects | Single Event | Hardness Assurance Testing
Paul W Marshall #6
Paul W Marshall
NRL consultant from Brookneal, Brookneal, VA, 24528, USA | N
Known for Proton Irradiation | Candidate Spacecraft Electronics | Single Event | Charge Collection
Peter S Winokur #7
Peter S Winokur
Sandia National Laboratories, Albuquerque, NM, 87185-1083, U
Known for Radiation Hardness | Interface States | Integrated Circuits | Border Traps
Steven John Zinkle #8
Steven John Zinkle
Department of Nuclear Engineering, University of Tennessee,
Known for Ion Irradiation | Mechanical Properties | Structural Materials | Room Temperature
William John Weber #9
William John Weber
University of Tennessee, Knoxville, TN, United States | Depa
Known for Damage Accumulation | Silicon Carbide | Ion Irradiation | Oxygen Vacancies
Robert A Reed #10
Robert A Reed
Department of Electrical and Computer Engineering, Vanderbil
Known for Sige Hbt | Radiation Effects | Displacement Damage | Charge Collection